this specification documents the detailed requirements for analog devices space qualified die including die qualification as described for class k in mil - prf - 38534, appendix c, table c - ii except as modified herein. the manufacturing flow descri bed in the standard d ie products program brochure a http://www.analog.com/marketsolutions/militaryaerospace/pdf/die_broc.pdf is to be considered a part of this specifi cation. this data sheet specifically details the space grade version of this product. a more detailed operational description and a complete data sheet for commercial product grades can be found at www.analog. com/mat02 the complete part number(s) of this specification follow: part number description mat02 - 000c low - noise matched dual monolithic transistor 1 . c1 2 . b1 3 . e1 4 . e2 5 . b2 6 . c2
collector to base voltage (bv cbo )............................... 40v collector to emitter voltage (bv ceo )............ . .......... ..... 40v emitter to emitter voltage (bv ee )......................... . ........... 40v collector current (i c ) ....................................................... 20ma emitter current (i e ) .......................................................... 20ma storage temperature range ........................... .............. - 65 c to +150 c junction temperature (t j ) ..+150c operating ambient temperature range ...... ................ - 55 c to +125 c absolute maximum ratings notes: 1/ stresses above the absolute maximum rating may cause perm anent damage to the device. extended operation at the maximum levels may degrade performance and affect reliability. in accordance with class - k version of mil - prf - 38534, appendix c, table c - ii, except as modified herein. (a) qual sample size and qual acceptance criteria C 25/2 (b) qual sample package C 6 lead to package (c) pre - screen electrical test over temperature performed post - assembly prior to die qualif ication.
table i notes: 1 / v cb = 15v, i c = 10 a, and t a = 25 c, unless otherwise specified. 2 / current gain match (?h fe ) is defined as h fe = . c fe b i min h ) i ( 100 ?
1/ v cb = 15v, i c = 10 a, and t a = 25 c, unless otherwise specified. 2 / current gain match (?h fe ) is defined as: h fe = . 3 / i cc and i ces are verified by measurement of i cbo . 4 / guaranteed by v os test tcv os ? v os for v os < 5.1 htrb is not applicable for this drawing. 5.2 burn - in is per mil - std - 883 method 1015 test condition a, b, or c. 5.3 steady state life test is per mil - std - 883 method 1005.
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